About Us

The Materials Characterization and Metrology Center is equipped with the tools and support needed to assist with material imaging and chemical analysis.

If you have a question about our services, have a concern, or require assistance, please don't hesitate to reach out to our team.

Anand Ramasubramanian
Center Director
Professor and Chair, Chemical and Materials Engineering
[email protected] 

Vacant
Scanning Electron Microscopy (SEM) Liaison

Craig England
X-Ray Diffraction (XRD) Liaison
Adjunct Professor, Chemical and Materials Engineering
[email protected]

Vacant
Atomic Force Microscopy (AFM) Liaison

John Lee
Optical Profilometry Liaison
Professor, Mechanical Engineering
[email protected]